Sum-frequency microscope can image an invisible 2D material

Phys.org12/8/2025 • Last cited 12/14/2025

Summary

Researchers at the Fritz Haber Institute have developed a sum-frequency microscope that can image single-atom-thick layers of boron nitride, a material typically invisible in optical microscopes due to a lack of optical resonances, according to Phys.org. This advancement could enhance the study of two-dimensional materials.

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